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    Volume 28 Issue 4
    Jul.  2003
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    Article Navigation >  Earth Science  > 2003  >  28(4): 467-470
    YANG Yong, XIAO Shao-quan, 2003. Introduction of Windows Software GZAF for Electron Probe Microanalysis. Earth Science, 28(4): 467-470.
    Citation: YANG Yong, XIAO Shao-quan, 2003. Introduction of Windows Software GZAF for Electron Probe Microanalysis. Earth Science, 28(4): 467-470.
    shu

    Introduction of Windows Software GZAF for Electron Probe Microanalysis

    • 1.

      Laser Institute, Huaz hong University of Science and Technology, Wuhan 430074, China

    • 2.

      Department of Mathematics and Physics, China University of Geosciences, Wuhan 430074, China

    • Received Date: 2002-09-27
    • Publish Date: 2003-07-25
      Abstract
    • GZAF software for Windows98 developed by ourselves using VB and VC supports many of the functions for electron probe analysis, such as hardware setup, drive and correction, quantitative analysis and data process, qualitative analysis, line scanning analysis of large sample, area/line (sem-) quantitative (image) analysis, character X-ray spectrum analysis, thickness measure of film, etc. The analysis reports in text files, 2D/3D graphs or images files. All the reports can use or process by means of general application software such as Office, WPS, Access, Photoshop, etc. Supporting any EPMA with 3 channel spectrometry with a need of only 32 digits interface software, GZAF software also works in half/full off-line mode and serves all EPMA users.

       

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      • References(7)
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      杨勇, 陆琦, 金星, 等. JCXA-733电子探针自动控制系统GZAF软件新设计[J]. 电子显微学报, 1998, 17 (2): 198-202. https://www.cnki.com.cn/Article/CJFDTOTAL-DZXV802.023.htm

      YANG Y, LU Q, JIN X, et al. New function of GZAF software for JCXA-733 EPMA control system[J]. Journal of Chinese Electron Microscopy Society, 1998, 17 (2): 198-202. https://www.cnki.com.cn/Article/CJFDTOTAL-DZXV802.023.htm
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      李志刚, 王微, 田地. Windows下电子探针软件系统的设计[J]. 分析仪器, 2000, 30(4): 14-16. https://www.cnki.com.cn/Article/CJFDTOTAL-FXYQ200004002.htm

      LI Z G, WANG W, TIAN D. Design of a software system under Windows for electron probe microanalysis[J]. Analytical Instrument, 2000, 30(4): 14-16. https://www.cnki.com.cn/Article/CJFDTOTAL-FXYQ200004002.htm
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      Toya T, Kato A. Practical techniques for microprobe analysis[M]. Tokyo: JEOL, 1983.
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      徐萃章. 电子探针分析原理[M]. 北京: 科学出版社, 1990.

      XU C Z. Principle of electron probe microanalysis[M]. Beijing: Science Press, 1990.
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      Goldstein J I, Joy D C, Newbury D E, 等. 扫描电子显微技术与X射线显微分析[M]. 张大同, 译. 北京: 科学出版社, 1988.

      Goldstein J I, Joy D C, Newbury D E, et al. Scanning electron microscopy and X-ray microanalysis[M]. Translated by ZHANG D T. Beijing: Science Press, 1988.
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      杨勇, 陈能松. 电子探针微区紫外阴极荧光分析系统及在沉积碎屑岩分析中的应用[J]. 地球科学——中国地质大学学报, 2003, 28(3): 357-360. https://www.cnki.com.cn/Article/CJFDTOTAL-DQKX200303021.htm

      YANG Y, CHEN N S. An EPMA ultraviolet cathodoluminescence micro-area measuring system and its application to petrogenetic analysis for clasolites[J]. Earth Science-Journal of China University of Geosciences, 2003, 28(3): 357-360. https://www.cnki.com.cn/Article/CJFDTOTAL-DQKX200303021.htm
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